Resultados de búsqueda

1

Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /

Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /

por International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th : 1991 : Wilmslow, England)
Publicado c1992.

Sin ejemplares

2

Development and application of semiconductor tracking detectors : proceedings of the Second International Symposium on Development and Application of Semiconductor Tracking Detectors (Hiroshima STD Symposium) : Hiroshima, Japan, October 10-13, 1995 /

Development and application of semiconductor tracking detectors : proceedings of the Second International Symposium on Development and Application of Semiconductor Tracking Detecto...

por International Symposium on Development and Application of Semiconductor Tracking Detectors (2nd : 1995 : Hiroshima, Japan)
Publicado 1996.

Sin ejemplares

3

Gallium arsenide and related compounds (Edinburgh), 1976 : proceedings of the sixth International Symposium on Gallium Arsenide and Related Compounds, Edinburgh Conference, 20-22 September 1976 /

Gallium arsenide and related compounds (Edinburgh), 1976 : proceedings of the sixth International Symposium on Gallium Arsenide and Related Compounds, Edinburgh Conference, 20-22 S...

por International Symposium on Gallium Arsenide and Related Compounds (6th : 1976 : Edinburgh)
Publicado 1977.

Libro

4

Radiation effects on semiconductor materials, detectors and devices : proceedings of the International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices : held at I.T. "G. Salvemini", Firenze, Italy, March 6-8, 1996 /

Radiation effects on semiconductor materials, detectors and devices : proceedings of the International Conference on Radiation Effects on Semiconductor Materials, Detectors and Dev...

por International Conference on Radiation Effects on Semiconductor Materials, Detectors and Devices (1996 : Florence, Italy)
Publicado c1997.

Sin ejemplares