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Evaluation standards /
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Evaluation standards /
Guardado en:
Detalles Bibliográficos
Formato:
Libro
Lenguaje:
Publicado:
[s. l. :
s. n.,
19--]
Materias:
Semiconductors
Existencias
Descripción
Tabla de Contenidos
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Vista Completa
Tabla de Contenidos:
Test procedures structural
Test procedures electrical
Test procedures mechanical
Test procedures visual.
Ejemplares similares
Containing papers presented at the International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies, (EXMATEC 2000) : May 21-24, 2000, Heraklion, Crete, Greece /
por: International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (5th : 2000 : Heraklion, Crete)
Publicado: (2001.)
Containing papers presented at the 3rd international workshop on expert evaluation and control of compound semiconductor materials and technologies (EXMATEC* ´96) : 12-15 May, 1996, Frieburg, Germany /
por: International workshop on expert evaluation and control of compound semiconductor materials and technologies (3rd : 1996 : Frieburg, Germany)
Publicado: (1997.)
Solid state devices, 1974 : seven invited papers presented at the fourth European Solid State Physics Device Research Conference (ESSDERC) held at the University of Nottingham, 16-19 September 1974.
por: European Solid State Devices Research Conference (4th : 1974 : University of Nottingham)
Publicado: (c1975.)
Analytical techniques for the characterization of compound semiconductors : proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /
por: Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors (1990 : Strasbourg, France)
Publicado: (1991.)
Semiconductors /
por: Smith, R. A. 1909-
Publicado: (1959.)
