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Evaluation standards /
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Evaluation standards /
Guardado en:
Detalles Bibliográficos
Formato:
Libro
Lenguaje:
Publicado:
[s. l. :
s. n.,
19--]
Materias:
Semiconductors
Existencias
Descripción
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Test procedures structural
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Containing papers presented at the International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies, (EXMATEC 2000) : May 21-24, 2000, Heraklion, Crete, Greece /
por: International Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (5th : 2000 : Heraklion, Crete)
Publicado: (2001.)
Containing papers presented at the 3rd international workshop on expert evaluation and control of compound semiconductor materials and technologies (EXMATEC* ´96) : 12-15 May, 1996, Frieburg, Germany /
por: International workshop on expert evaluation and control of compound semiconductor materials and technologies (3rd : 1996 : Frieburg, Germany)
Publicado: (1997.)
Solid state devices, 1974 : seven invited papers presented at the fourth European Solid State Physics Device Research Conference (ESSDERC) held at the University of Nottingham, 16-19 September 1974.
por: European Solid State Devices Research Conference (4th : 1974 : University of Nottingham)
Publicado: (c1975.)
Analytical techniques for the characterization of compound semiconductors : proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /
por: Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors (1990 : Strasbourg, France)
Publicado: (1991.)
Semiconductors /
por: Smith, R. A. 1909-
Publicado: (1959.)
