Advances in x-ray analysis. proceedings of the twentieth annual Conference on Applications of X-Ray Analysis, held August 11-13, 1971 / Volume 15 :

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Detalles Bibliográficos
Otros Autores:	Heinrich, Kurt F. J., Barrett, C. S. 1902-, Newkirk, John B., Ruud, C. O., Denver Research Institute. Metallurgy and Materials Sciences Division.
Formato:	Libro
Lenguaje:
Publicado:	New York : Plenum Press, 1972.
Materias:	Radiation, Ionizing > methods. X-Ray Diffraction. Spectrometry, X-Ray Emission.

Descripción
Descripción Física:	xii, 573 p. : il. ; 26 cm.

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