Ellipsometry in the measurement of surfaces and thin films ; symposium proceedings.

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Detalles Bibliográficos
Autor principal: Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films (1963 : Washington, D.C.)
Autor Corporativo: Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films
Otros Autores: Passaglia, Elio, ed., Stromberg, Robert R., ed., Kruger, Jerome, ed.
Formato: Libro
Lenguaje:
Publicado: Washington : U.S. National Bureau of Standards, 1964.
Colección:United States. National Bureau of Standards. Miscellaneous publication ; 256.
Materias:
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245 1 0 |a Ellipsometry in the measurement of surfaces and thin films ;  |b symposium proceedings. 
260 # # |a Washington :  |b U.S. National Bureau of Standards,  |c 1964. 
300 # # |a vi, 359 p. :  |b il. ;  |c 24 cm. 
504 # # |a Incluye referencias bibliográficas. 
111 2 # |a Symposium on the Ellipsometer and its Use in the Measurement of Surfaces and Thin Films  |d (1963 :  |c Washington, D.C.) 
700 1 # |a Passaglia, Elio,  |e ed. 
700 1 # |a Stromberg, Robert R.,  |e ed. 
700 1 # |a Kruger, Jerome,  |e ed. 
810 1 # |a United States.  |b National Bureau of Standards.  |t Miscellaneous publication ;  |v 256. 
086 # # |a C 13.10:256 
650 # 0 |a Polarization (Light) 
650 # 0 |a Surfaces (Technology) 
650 # 0 |a Thin films. 
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050 0 0 |a QC100  |b .U57 no. 256 
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490 1 # |a United States. National Bureau of Standards. Miscellaneous publication ;  |v 256. 
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500 # # |a Edited by E. Passaglia, R.R. Strombery, and J. Kruger. 
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