Ionizing radiation effects in MOS devices and circuits /

Ionizing radiation effects in MOS devices and circuits /

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Detalles Bibliográficos
Otros Autores:	Ma, T. P., Dressendorfer, Paul V.
Formato:	Libro
Lenguaje:
Publicado:	New York : Wiley, c1989.
Materias:	Metal oxide semiconductors > Effect of radiation on.
Acceso en línea:	Reseña

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