Spectroscopic ellipsometry /
Proceedings of the 2nd International Conference on Spectroscopy Ellipsometry, Charleston, South Carolina, USA
Guardado en:
| Autor principal: | |
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| Autor Corporativo: | |
| Otros Autores: | , , |
| Formato: | Sin ejemplares |
| Lenguaje: | |
| Publicado: |
Amsterdam :
Elsevier,
1998.
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| Colección: | Thin Solid Films,
v. 313-314 |
| Materias: |
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| 245 | 1 | 0 | |a Spectroscopic ellipsometry / |c Guest editors, R. W. Collins, E. D. Aspnes [and] E. A. Irene. |
| 260 | # | # | |a Amsterdam : |b Elsevier, |c 1998. |
| 300 | # | # | |a x, 850 p. |
| 504 | # | # | |a Incluye referencias bibliográficas e índices. |
| 520 | # | # | |a Proceedings of the 2nd International Conference on Spectroscopy Ellipsometry, Charleston, South Carolina, USA |
| 111 | 2 | # | |a International Conference on Spectroscopy Ellipsometry |n (2nd : |d 1997 : |c Charleston, South Carolina, USA) |
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| 650 | # | 7 | |a Congresses. |2 inist |
| 700 | 1 | # | |a Collins, R. W, |e ed. |4 edt |
| 700 | 1 | # | |a Aspnes, E. D., |e ed. |4 edt |
| 700 | 1 | # | |a Irene, E.A., |e ed. |4 edt |
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