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| 005 |
20081114163803.0 |
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| 001 |
BCCAB014598 |
| 003 |
AR-BCCAB |
| 245 |
1 |
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|a Physical principles of electron microscopy :
|b an introduction to TEM, SEM, and AEM /
|c Ray F. Egerton.
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| 260 |
# |
# |
|a New York, NY :
|b Springer,
|c c2005.
|
| 300 |
# |
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|a xii, 202 p. :
|b il. ;
|c 25 cm.
|
| 504 |
# |
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|a Bibliografía: p. [195]-196.
|
| 020 |
# |
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|z 9780387258000
|
| 020 |
# |
# |
|a 0387258000
|
| 100 |
1 |
# |
|a Egerton, R. F.
|
| 080 |
# |
# |
|a 537.533.35
|
| 650 |
# |
7 |
|a Electron microscopy.
|2 inist
|
| 650 |
# |
7 |
|a Microscopía electrónica.
|2 inist
|
| 010 |
# |
# |
|a ##2005924717
|
| 050 |
0 |
0 |
|a QH212.E4
|b E354 2005
|
| 072 |
# |
# |
|a QC
|2 lcco
|
| 040 |
# |
# |
|a OHX
|c OHX
|d UAB
|d IXA
|d DLC
|d arbccab
|b spa
|
| 500 |
# |
# |
|a Incluye índice.
|
| 856 |
4 |
1 |
|3 Indice
|u http://www.loc.gov/catdir/tocs/fy0605/2005924717.html42
|3 Reseña
|u http://www.loc.gov/catdir/enhancements/fy0663/2005924717-d.html
|
| 942 |
# |
# |
|c BK
|
| 952 |
# |
# |
|2 udc
|a ARBCCAB
|b ARBCCAB
|d 20080704
|e Blackwell
|g U$S85.55
|i 20543
|o 537.533.35 E292
|p 20543
|t 1
|y BK
|
