Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis /

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologi...

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Detalles Bibliográficos
Otros Autores: Tanaka, Nobuo, 1949-
Formato: Libro
Lenguaje:Inglés
Publicado: Hackensack, NJ : Imperial College Press, c2015.
Materias:
Acceso en línea:Tapa
Indice
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245 0 0 |a Scanning transmission electron microscopy of nanomaterials :  |b basics of imaging and analysis /  |c [edited by] Nobuo Tanaka, Nagoya University, Japan. 
260 # # |a Hackensack, NJ :  |b Imperial College Press,  |c c2015. 
300 # # |a xxxiii, 571 p. :  |b il. (some color) ;  |c 24 cm. 
504 # # |a Incluye referencias bibliográficas e índice. 
520 # # |a The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Readership: Graduate students and researchers in the field of nanomaterials and nanostructures. 
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