Beam injection assessment of defects in semiconductors.

Beam injection assessment of defects in semiconductors.

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Detalles Bibliográficos
Autor principal: International Workshop on Beam Injection Assessment of Defects in Semiconductors. (1988 July : Meudon-Bellevue, France)
Autor Corporativo: International Workshop on Beam Injection Assessment of Defects in Semiconductors.
Formato: Sin ejemplares
Lenguaje:Inglés
Publicado: Les Ulis : Editions de physique.
Colección:Journal de physique, C6 Colloque.
Materias:
Semiconductors > Defects > Congresses.
Electron beams > Congresses.
Descripción
Notas:Description based on: 2nd (1991).
Descripción Física:v. : il. ; 25 cm.

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