Surface characterization by LEED, RHEED, REM, STM, and Holography : proceedings of the U.S.-Japan Seminar on Surface Characterization by Electon Diffraction, Reflection Electron Mi...

por U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography (1993 : Kona, Hawaii)
Publicado 1993.