Detalles Bibliográficos
Autor principal: |
U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography (1993 : Kona, Hawaii) |
Autor Corporativo: |
U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography |
Otros Autores: |
Cohen, P. I.,
Ichimiya, A. |
Formato: | Sin ejemplares
|
Lenguaje: | |
Publicado: |
[Amsterdam, Netherlands] :
North-Holland,
1993.
|
Colección: | Surface Science 1993 ;
v. 298, no. 2-3
|