Detalles Bibliográficos
| Autor principal: |
U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography (1993 : Kona, Hawaii) |
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| Autor Corporativo: |
U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography |
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| Otros Autores: |
Cohen, P. I.,
Ichimiya, A. |
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| Formato: | Sin ejemplares
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| Lenguaje: | Inglés |
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| Publicado: |
[Amsterdam, Netherlands] :
North-Holland,
1993.
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| Colección: | Surface Science 1993 ;
v. 298, no. 2-3
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