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| 005 |
20101012170138.0 |
| 003 |
AR-BCCAB |
| 245 |
1 |
0 |
|a Semiconductor measurements and instrumentation /
|c W. R. Runyan.
|
| 260 |
# |
# |
|a New York :
|b McGraw-Hill,
|c [1975]
|
| 300 |
# |
# |
|a vii, 280 p. :
|b il. ;
|c 26 cm.
|
| 490 |
0 |
# |
|a Texas Instruments electronics series
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas e índice.
|
| 020 |
# |
# |
|a 0070542732
|
| 100 |
1 |
# |
|a Runyan, W. R.
|
| 080 |
# |
# |
|a 621.382
|
| 650 |
# |
0 |
|a Semiconductors.
|
| 650 |
# |
7 |
|a Materiales semiconductores.
|2 inist
|
| 010 |
# |
# |
|a ###75019035#
|
| 050 |
0 |
0 |
|a QC611.24
|b .R86
|
| 040 |
# |
# |
|a DLC
|c DLC
|d DLC
|b spa
|d arbccab
|
| 856 |
# |
# |
|u http://campi.cab.cnea.gov.ar/tocs/19382.pdf
|
| 082 |
0 |
0 |
|a 537.6/22
|
| 942 |
# |
# |
|c BK
|
| 952 |
# |
# |
|2 udc
|a ARBCCAB
|b ARBCCAB
|d 20050812
|i 19382
|o 621.382 R876 S
|p 19382
|t 1
|y BK
|
