Surface characterization by LEED, RHEED, REM, STM, and Holography : proceedings of the U.S.-Japan Seminar on Surface Characterization by Electon Diffraction, Reflection Electron Microscopy, and Holography, Kona, Hawaii, 16-19 March 1993 /
por: U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography (1993 : Kona, Hawaii)
Publicado: (1993.)
