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00813nam#a2200241#a#4500 |
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700203s1970####nyua#####b####001#0#eng## |
| 005 |
20060202074707.0 |
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BCCAB005636 |
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AR-BCCAB |
| 245 |
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|a Characterization of semiconductor materials /
|c [by] Philip F. Kane [and] Graydon B. Larrabee.
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| 260 |
# |
# |
|a New York :
|b McGraw-Hill,
|c [1970]
|
| 300 |
# |
# |
|a xvi, 351 p. :
|b il. ;
|c 26 cm.
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas.
|
| 100 |
1 |
# |
|a Kane, Philip F.,
|d 1920-
|
| 700 |
1 |
# |
|a Larrabee, Graydon B.,
|d 1932-
|e joint author.
|
| 650 |
# |
0 |
|a Semiconductors.
|
| 010 |
# |
# |
|a ###79081607#
|
| 050 |
0 |
0 |
|a QC612.S4
|b K26
|
| 490 |
1 |
# |
|a Texas instruments electronics series
|
| 040 |
# |
# |
|a DLC
|c DLC
|d DLC
|b spa
|d arbccab
|
| 082 |
0 |
0 |
|a 537.6/22
|
| 942 |
# |
# |
|c BK
|
| 952 |
# |
# |
|2 udc
|a ARBCCAB
|b ARBCCAB
|i 6879
|o 621.382 K131
|p 6879
|t 1
|y BK
|
