$International Workshop on Evaluation of Single-Crystal Diffraction Data from 2-D Position-Sensitive Detectors, November 4-6, 1985, Grenoble (France).$

International Workshop on Evaluation of Single-Crystal Diffraction Data from 2-D Position-Sensitive Detectors, November 4-6, 1985, Grenoble (France).

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Detalles Bibliográficos
Autor principal:	International Workshop on Evaluation of Single-Crystal Diffraction Data from 2-D Position-Sensitive Detectors (1985 : Grenoble, France)
Autor Corporativo:	International Workshop on Evaluation of Single-Crystal Diffraction Data from 2-D Position-Sensitive Detectors
Formato:	Sin ejemplares
Lenguaje:	Inglés
Publicado:	Les Ulis Cedex : Les éditions de physique, 1986.
Colección:	Journal de physique. Colloque ; t.47,C5
Materias:	Crystals > Diffraction > Congresses. Position sensitive particle detectors > Congresses.

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