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| LEADER |
01515cam#a2200313ua#4500 |
| 008 |
000309s2000####ne#a##########101#0#eng#d |
| 005 |
20060726153950.0 |
| 001 |
BCCAB008435 |
| 003 |
AR-BCCAB |
| 245 |
1 |
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|a Papers presented at the European Materials Research Society 1999 Spring Meeting, Symposium F: Process Induced Defects in Semiconductors, June 1-4, 1999, Strasbourg, France /
|c guest editors, A. Mesli, W. Schröter, J. Weber.
|
| 260 |
# |
# |
|a Amsterdam :
|b Elsevier,
|c c2000.
|
| 300 |
# |
# |
|a ix, 340 p. :
|b il. ;
|c 28 cm.
|
| 111 |
2 |
# |
|a Symposium F: Process Induced Defects in Semiconductors
|d (1999 :
|c Strasbourg, France)
|
| 700 |
1 |
# |
|a Mesli, A.
|
| 700 |
1 |
# |
|a Schröter, W.
|q (Wolfgang)
|
| 700 |
1 |
# |
|a Weber, J.
|
| 710 |
2 |
# |
|a European Materials Research Society.
|b Meeting
|d (1999 :
|c Strasbourg, France)
|
| 246 |
3 |
0 |
|a Papers presented at the European Materials Research Society 1999 Spring Meeting
|
| 246 |
3 |
0 |
|a Symposium F: Process Induced Defects in Semiconductors
|
| 246 |
3 |
0 |
|a Process induced defects in semiconductors
|
| 246 |
1 |
8 |
|a E-MRS Spring '99, Symposium F
|
| 650 |
# |
0 |
|a Semiconductors
|x Defects
|v Congresses.
|
| 490 |
1 |
# |
|a Materials science & engineering. B, Solid-state materials for advanced technology ;
|v v. B71 (14 Feb., 2000).
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas.
|
| 040 |
# |
# |
|a HNK
|c HNK
|b spa
|d arbccab
|
| 500 |
# |
# |
|a "Special issue"--P. v.
|
| 500 |
# |
# |
|a Incluye indices.
|
| 942 |
# |
# |
|c BK
|
| 952 |
# |
# |
|2 udc
|7 NOT_LOAN
|a ARBCCAB
|b ARBCCAB
|i 008435_nuevo-0
|o MATER. SCI. ENG. B 2000
|p 008435_nuevo-0
|t 1
|y BK
|
