Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /

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Detalles Bibliográficos
Autor principal: International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th : 1991 : Wilmslow, England)
Autor Corporativo: International Symposium on Defect Recognition and Image Processing in III-V Compounds
Otros Autores: Brozel, M. R. ed., Stirland, D. J. ed.
Formato: Sin ejemplares
Lenguaje:
Publicado: Bristol, England ; Philadelphia : Adam Hilger, c1992.
Colección:Semiconductor Science Technology 1992 ; v. 7, no. 1A
Materias:
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245 1 0 |a Defect recognition in semiconductors before and after processing :  |b proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /  |c edited by M.R. Brozel, D.J. Stirland. 
260 # # |a Bristol, England ;  |a Philadelphia :  |b Adam Hilger,  |c c1992. 
300 # # |a 310 p. :  |b il. (algunbas col.) ;  |c 31 cm. 
504 # # |a Incluye referencias bibliográficas. 
111 2 # |a International Symposium on Defect Recognition and Image Processing in III-V Compounds  |n (4th :  |d 1991 :  |c Wilmslow, England) 
650 # 0 |a Semiconductors  |x Defects  |v Congresses. 
650 # 0 |a Photoluminescence  |v Congresses. 
650 # 0 |a Gallium arsenide semiconductors  |v Congresses. 
700 1 # |a Brozel, M. R.  |q (Michael R.),  |e ed.  |4 edt 
700 1 # |a Stirland, D. J.  |q (Derek J.),  |e ed.  |4 edt 
490 1 # |a Semiconductor Science Technology 1992 ;  |v v. 7, no. 1A 
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