Defect recognition in semiconductors before and after processing : proceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /
Guardado en:
Autor principal: | International Symposium on Defect Recognition and Image Processing in III-V Compounds (4th : 1991 : Wilmslow, England) |
---|---|
Autor Corporativo: | International Symposium on Defect Recognition and Image Processing in III-V Compounds |
Otros Autores: | Brozel, M. R. ed., Stirland, D. J. ed. |
Formato: | Sin ejemplares |
Lenguaje: | |
Publicado: |
Bristol, England ; Philadelphia :
Adam Hilger,
c1992.
|
Colección: | Semiconductor Science Technology 1992 ;
v. 7, no. 1A |
Materias: |
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