|
|
|
|
LEADER |
00644nam#a22001935a#4500 |
008 |
061017s1989####si############001#0#eng#d |
005 |
20061017165218.0 |
001 |
BCCAB012381 |
003 |
AR-BCCAB |
245 |
1 |
0 |
|a Defect processes induced by electronic excitation in insulators /
|c edited by Noriaki Itoh.
|
260 |
# |
# |
|a Singapore :
|b World Scientific,
|c c1989.
|
300 |
# |
# |
|a 280 p.
|
504 |
# |
# |
|a Incluye referencias bibliográficas e índice.
|
020 |
# |
# |
|a 9971503514
|
700 |
1 |
# |
|a Itoh, Noriaki.
|
040 |
# |
# |
|a arbccab
|b spa
|
856 |
# |
# |
|u http://campi.cab.cnea.gov.ar/tocs/18602.pdf
|
942 |
# |
# |
|c BK
|
952 |
# |
# |
|2 udc
|a ARBCCAB
|b ARBCCAB
|d 20030111
|i 18602
|o 5838.9
|p 18602
|t 1
|y BK
|