Defect processes induced by electronic excitation in insulators /

Defect processes induced by electronic excitation in insulators /

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Detalles Bibliográficos
Otros Autores:	Itoh, Noriaki.
Formato:	Libro
Lenguaje:	Inglés
Publicado:	Singapore : World Scientific, c1989.
Acceso en línea:	http://campi.cab.cnea.gov.ar/tocs/18602.pdf

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