Spectroscopic ellipsometry /
Proceedings of the 2nd International Conference on Spectroscopy Ellipsometry, Charleston, South Carolina, USA
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Autor Corporativo: | |
Otros Autores: | , , |
Formato: | Sin ejemplares |
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Publicado: |
Amsterdam :
Elsevier,
1998.
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Colección: | Thin Solid Films,
v. 313-314 |
Materias: |
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245 | 1 | 0 | |a Spectroscopic ellipsometry / |c Guest editors, R. W. Collins, E. D. Aspnes [and] E. A. Irene. |
260 | # | # | |a Amsterdam : |b Elsevier, |c 1998. |
300 | # | # | |a x, 850 p. |
504 | # | # | |a Incluye referencias bibliográficas e índices. |
520 | # | # | |a Proceedings of the 2nd International Conference on Spectroscopy Ellipsometry, Charleston, South Carolina, USA |
111 | 2 | # | |a International Conference on Spectroscopy Ellipsometry |n (2nd : |d 1997 : |c Charleston, South Carolina, USA) |
080 | # | # | |a 533.9:061.3 |
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650 | # | 7 | |a Congresses. |2 inist |
700 | 1 | # | |a Collins, R. W, |e ed. |4 edt |
700 | 1 | # | |a Aspens, E. D., |e ed. |4 edt |
700 | 1 | # | |a Irene, E.A., |e ed. |4 edt |
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