Spectroscopic ellipsometry /

Spectroscopic ellipsometry /

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Proceedings of the 2nd International Conference on Spectroscopy Ellipsometry, Charleston, South Carolina, USA

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Detalles Bibliográficos
Autor principal:	International Conference on Spectroscopy Ellipsometry (2nd : 1997 : Charleston, South Carolina, USA)
Autor Corporativo:	International Conference on Spectroscopy Ellipsometry
Otros Autores:	Collins, R. W, ed., Aspens, E. D., ed., Irene, E.A., ed.
Formato:	Sin ejemplares
Lenguaje:
Publicado:	Amsterdam : Elsevier, 1998.
Colección:	Thin Solid Films, v. 313-314
Materias:	Thin films Optics Capas finas Congresos. Optica Congresses.

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