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|a Reflection electron microscopy and spectroscopy for surface analysis /
|c Zhong Lin Wang.
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|a Cambridge ;
|a New York :
|b Cambridge University Press,
|c 1996.
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|a xix, 436 p. :
|b il. ;
|c 26 cm.
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|a Bibliografía: p. 419-430.
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|a 0521482666
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|a 0521017955 (pbk)
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|a Wang, Zhong Lin.
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|a 537.533.35:538.971
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|a Materials
|x Microscopy.
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|a Surfaces (Technology)
|x Analysis.
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|a Reflection electron microscopy.
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# |
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|a Microscopía electrónica
|e Superficies.
|2 inist
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|a ###95033552#
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|a TA417.23
|b .W36 1996
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|a DLC
|c DLC
|b spa
|d arbccab
|d DLC
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|a Incluye índice.
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|3 Reseña
|u http://www.loc.gov/catdir/description/cam027/95033552.html
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|3 Indice
|u http://www.loc.gov/catdir/toc/cam021/95033552.html
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|a 620/.44
|2 20
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|c BK
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|2 udc
|a ARBCCAB
|b ARBCCAB
|d 20090731
|i 20960
|o 537.533.35:538.971 W185
|p 20960
|t 1
|y BK
|