Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation /

Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation /

Guardado en:
Detalles Bibliográficos
Autor principal: International Conference on Ion Beam Surface Layer Analysis (1st : 1973 : Yorktown Heights, N.Y.)
Autor Corporativo: International Conference on Ion Beam Surface Layer Analysis
Otros Autores: Mayer, James W., 1930- ed., Ziegler, J. F. ed., National Science Foundation (U.S.), International Business Machines Corporation.
Formato: Libro
Lenguaje:
Publicado: Lausanne : Elsevier Sequoia S.A., 1974.
Materias:
Thin films > Congresses.
Descripción
Notas:"These proceedings were originally published in Thin solid films."
Descripción Física:viii, 463 p. : il. ; 25 cm.
Bibliografía:Incluye referencias bibliográficas.
ISBN:044419536X

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