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|a Ion beam surface layer analysis ;
|b proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation /
|c Edited by: James W. Mayer and James F. Ziegler.
|
| 260 |
# |
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|a Lausanne :
|b Elsevier Sequoia S.A.,
|c 1974.
|
| 300 |
# |
# |
|a viii, 463 p. :
|b il. ;
|c 25 cm.
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas.
|
| 020 |
# |
# |
|a 044419536X
|
| 111 |
2 |
# |
|a International Conference on Ion Beam Surface Layer Analysis
|n (1st :
|d 1973 :
|c Yorktown Heights, N.Y.)
|
| 700 |
1 |
# |
|a Mayer, James W.,
|d 1930-
|e ed.
|
| 700 |
1 |
# |
|a Ziegler, J. F.
|q (James F.),
|e ed.
|
| 710 |
2 |
# |
|a National Science Foundation (U.S.)
|
| 710 |
2 |
# |
|a International Business Machines Corporation.
|
| 650 |
# |
0 |
|a Thin films
|v Congresses.
|
| 010 |
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|a ###74000348#
|
| 050 |
0 |
0 |
|a QC176.82
|b .I55 1973
|
| 049 |
# |
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|a AR5A
|
| 040 |
# |
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|a DLC
|c DLC
|d OCL
|b spa
|d arbccab
|
| 500 |
# |
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|a "These proceedings were originally published in Thin solid films."
|
| 082 |
0 |
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|a 541/.3453
|
| 942 |
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|c BK
|
| 952 |
# |
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|2 udc
|a ARBCCAB
|b ARBCCAB
|i 4428
|o 537.534:061.3 I8 1973
|p 4428
|t 1
|y BK
|
