Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation /

Ion beam surface layer analysis ; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation /

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Detalles Bibliográficos
Autor principal:	International Conference on Ion Beam Surface Layer Analysis (1st : 1973 : Yorktown Heights, N.Y.)
Autor Corporativo:	International Conference on Ion Beam Surface Layer Analysis
Otros Autores:	Mayer, James W., 1930- ed., Ziegler, J. F. ed., National Science Foundation (U.S.), International Business Machines Corporation.
Formato:	Libro
Lenguaje:
Publicado:	Lausanne : Elsevier Sequoia S.A., 1974.
Materias:	Thin films > Congresses.

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