SPM '99 : proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures, Seattle, USA, May-June1, 1999 /

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Detalles Bibliográficos
Autor principal: International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures (1st : 1999 : Seattle)
Autor Corporativo: International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures
Otros Autores: Hörber, J. K. Heinrich.
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam : Elsevier, 2000.
Materias:
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245 1 0 |a SPM '99 :  |b proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures, Seattle, USA, May-June1, 1999 /  |c guest editor, J.K. Heinrich Hörber. 
260 # # |a Amsterdam :  |b Elsevier,  |c 2000. 
300 # # |a xiii, 314 p. :  |b il. (some col.) ;  |c 27 cm. 
111 2 # |a International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures  |n (1st :  |d 1999 :  |c Seattle) 
700 1 # |a Hörber, J. K. Heinrich. 
730 0 # |a Ultramicroscopy.  |n V. 82, no. 1-4. 
246 1 4 |a Scanning probe microscopy, cantilever sensors & nanostructures 
246 3 # |a Scanning probe microscopy, cantilever sensors and nanostructures 
246 3 0 |a Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures 
650 # 0 |a Scanning probe microscopy  |v Congresses. 
650 # 0 |a Detectors  |v Congresses. 
650 # 0 |a Nanostructures  |v Congresses. 
049 # # |a AR5A 
504 # # |a Incluye referencias bibliográficas. 
040 # # |a HNK  |c HNK  |b spa  |d arbccab 
500 # # |a Issued as: Ultramicroscopy, v. 82, nos. 1-4 (Feb. 2000). 
500 # # |a Incluye indices. 
942 # # |c BK 
952 # # |2 udc  |7 NOT_LOAN  |a ARBCCAB  |b ARBCCAB  |i 008128_nuevo-0  |o ULTRAMICROSCOPY 2000  |p 008128_nuevo-0  |t 1  |y BK