Scanning probe microscopy /

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Detalles Bibliográficos
Autor principal:	International Colloquium on Scanning Probe Microscopy (8th : 2000 : Shizuoka-ken, Japan)
Autor Corporativo:	International Colloquium on Scanning Probe Microscopy
Otros Autores:	Yoshimura, Masamichi., Oyo Butsuri Gakkai., Foundation Advanced Technology Institute., Asian Scanning Probe Microscopy
Formato:	Sin ejemplares
Lenguaje:
Publicado:	Tokyo, Japan : Institute of Pure and Applied Physics, c2001.
Colección:	Japanese journal of applied physics. Part 1, Regular papers, short notes & review papers ; 40, no. 6B (Jun. 2001).
Materias:	Scanning probe microscopy > Congresses.

Descripción
Notas:	"Special issue." "The 8th International Colloquium on Scanning Probe Microscopy and Asian Scanning Probe Microscopy (3) were jointly held at Atagawa Haitsu, Shizuoka Pref., from December 7 to 9, 2000, sponsored by the Japan Society of Applied Physics and Foundation Advanced Technology Institute."--P. [iv]. Incluye índice.
Descripción Física:	p. 4273-4429, [15] : il. ; 30 cm.
Bibliografía:	Incluye referencias bibliográficas.

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