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020716s2001####ja#a#####b####101#0#eng#d |
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BCCAB008326 |
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|a Scanning probe microscopy /
|c edited by Masamichi Yoshimura ... [et al.].
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| 260 |
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|a Tokyo, Japan :
|b Institute of Pure and Applied Physics,
|c c2001.
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| 300 |
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|a p. 4273-4429, [15] :
|b il. ;
|c 30 cm.
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2 |
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|a International Colloquium on Scanning Probe Microscopy
|n (8th :
|d 2000 :
|c Shizuoka-ken, Japan)
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1 |
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|a Yoshimura, Masamichi.
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2 |
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|a Oyo Butsuri Gakkai.
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| 710 |
2 |
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|a Foundation Advanced Technology Institute.
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2 |
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|a Asian Scanning Probe Microscopy
|n (3rd :
|d 2000 :
|c Shizuoka-ken, Japan)
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| 080 |
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|a 537.533.35:061.3
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|a Scanning probe microscopy
|v Congresses.
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|a Japanese journal of applied physics. Part 1, Regular papers, short notes & review papers ;
|v 40, no. 6B (Jun. 2001).
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| 504 |
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|a Incluye referencias bibliográficas.
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| 040 |
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|a HNK
|c HNK
|d OCLCQ
|d HNK
|b spa
|d arbccab
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|a "Special issue."
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|a "The 8th International Colloquium on Scanning Probe Microscopy and Asian Scanning Probe Microscopy (3) were jointly held at Atagawa Haitsu, Shizuoka Pref., from December 7 to 9, 2000, sponsored by the Japan Society of Applied Physics and Foundation Advanced Technology Institute."--P. [iv].
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|a Incluye índice.
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| 942 |
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|c BK
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|2 udc
|7 NOT_LOAN
|a ARBCCAB
|b ARBCCAB
|i 008326_nuevo-0
|o JPN. J. APPL. PHYS.
|p 008326_nuevo-0
|t 1
|y BK
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