Particle induced x-ray emission and its analytical applications : proceedings of the Sixth International Conference on PIXE and its Analytical Applications, Tokyo, Japan, July 20-24, 1992 /

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Detalles Bibliográficos
Autor principal: International Conference on PIXE and its Analytical Applications (6th : 1992 : Tokyo, Japan)
Autor Corporativo: International Conference on PIXE and its Analytical Applications
Otros Autores: Uda, M.
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam : North-Holland, 1993.
Colección:Nuclear instruments & methods in physics research. Section B ; v. 75
Materias:
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245 1 0 |a Particle induced x-ray emission and its analytical applications :  |b proceedings of the Sixth International Conference on PIXE and its Analytical Applications, Tokyo, Japan, July 20-24, 1992 /  |c editor, M. Uda. 
260 # # |a Amsterdam :  |b North-Holland,  |c 1993. 
300 # # |a xix, 603 p. :  |b il. ;  |c 27 cm. 
111 2 # |a International Conference on PIXE and its Analytical Applications  |n (6th :  |d 1992 :  |c Tokyo, Japan) 
700 1 # |a Uda, M. 
080 # # |a 543.422.8:061.3 
650 # 0 |a Proton-induced X-ray emission  |v Congresses. 
490 1 # |a Nuclear instruments & methods in physics research. Section B ;  |v v. 75 
504 # # |a Incluye referencias bibliográficas. 
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500 # # |a Incluye índice. 
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