Particle induced x-ray emission and its analytical applications : proceedings of the 2nd International Conference on PIXE and Its Analytical Applications, Lund, Sweden, June 9-12, 1980 /

Particle induced x-ray emission and its analytical applications : proceedings of the 2nd International Conference on PIXE and Its Analytical Applications, Lund, Sweden, June 9-12, 1980 /

Guardado en:
Detalles Bibliográficos
Autor principal: International Conference on Particle Induced X-ray Emission and Its Analytical Applications (2nd : 1980 : Lund, Sweden)
Autor Corporativo: International Conference on Particle Induced X-ray Emission and Its Analytical Applications
Otros Autores: Johansson, Sven A. E., 1923-
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam : North-Holland, 1981.
Colección:Nuclear instruments & methods, v. 181
Materias:
X-ray microanalysis > Congresses.
X-ray spectroscopy > Congresses.
Descripción
Notas:Incluye índice.
Descripción Física:xv, 546 p. : il. ; 27 cm.
Bibliografía:Incluye referencias bibliográficas.
ISSN:0029-554X ;

Ejemplares similares