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01085cam#a22002894a#4500 |
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20061101154636.0 |
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020803s2003####nyua#####b####001#0#eng## |
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BCCAB012832 |
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AR-BCCAB |
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|a Scanning electron microscopy and x-ray microanalysis /
|c Joseph I. Goldstein ... [et al.].
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|a 3rd ed.
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|a New York :
|b Kluwer Academic/Plenum Publishers,
|c c2003.
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300 |
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|a xix, 689 p. :
|b il. (some col.) ;
|c 26 cm. +
|e 1 CD-ROM (4 3/4 in.)
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|a 0306472929
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|a Goldstein, Joseph,
|d 1939-
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|a Scanning electron microscopy.
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|a X-ray microanalysis.
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|a ##2002028276
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|a QH212.S3
|b S29 2003
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|a Incluye referencias bibliográficas.
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|a DLC
|c DLC
|d DLC
|b spa
|d arbccab
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|a Incluye índice.
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|u http://campi.cab.cnea.gov.ar/tocs/19883.pdf
|3 Indice
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|a 502/.8/25
|2 21
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|c BK
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|2 udc
|a ARBCCAB
|b ARBCCAB
|d 20061003
|e Amazon
|i 19883
|o 537.533.35 G578 Ed.3
|p 19883
|t 1
|y BK
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952 |
# |
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|2 udc
|a ARBCCAB
|b ARBCCAB
|i 19888
|o 537.533.35 G578 Ed.3 CD-ROM
|p 19888
|t 2
|y CF
|