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050110s20052003nyua###f#b####001#0#eng## |
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|a Fundamentals of powder diffraction and structural characterization of materials /
|c by Vitalij K. Pecharsky, Peter Y. Zavalij.
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260 |
# |
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|a New York :
|b Springer,
|c c2005.
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300 |
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|a xxiii, 713 p. :
|b il. ;
|c 24 cm. +
|e 1 CD-ROM (12 cm.)
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504 |
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|a Incluye referencias bibliográficas e índice.
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|a Originalmente publicado: Boston : Kluwer Academic Publishers, c2003.
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|a Acompañado de CD-ROM que contiene versiones en color de las figuras, ejemplos, problemas y soluciones.
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|a 0387241477 (softcover)
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|a 0387245677 (e-book)
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|a Pecharsky, Vitalij K.
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700 |
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|a Zavalij, Peter Y.
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|a 548.73
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|a X-rays
|x Diffraction
|x Measurement.
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|a Powders
|x Optical properties
|x Measurement.
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|a X-ray crystallography.
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650 |
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7 |
|a Difracción de rayos x.
|2 inist
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7 |
|a Polvos.
|2 inist
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|a Cristalografía.
|2 inist
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|a Propiedades ópticas
|2 inist
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|a DLC
|c DLC
|d BAKER
|d C#P
|d UBA
|d DLC
|b spa
|d arbccab
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|3 Indice.
|u http://campi.cab.cnea.gov.ar/tocs/20076.pdf
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|c BK
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|2 udc
|a ARBCCAB
|b ARBCCAB
|g U$S99.80
|i 20076
|o 548.73 P332
|p 20076
|t 1
|y BK
|
952 |
# |
# |
|2 udc
|a ARBCCAB
|b ARBCCAB
|i 20077
|o CD-ROM 548.73 P332
|p 20077
|t 2
|y BK
|
952 |
# |
# |
|2 udc
|a ARBCCAB
|b ARBCCAB
|d 20080808
|e Blackwell
|i 20575
|o CD-ROM 548.73 P332
|p 20575
|t 3
|y BK
|
952 |
# |
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|2 udc
|a ARBCCAB
|b ARBCCAB
|d 20080808
|e Blackwell
|g U$S108.39
|i 20556
|o 548.73 P332 Ej.2
|p 20556
|t 4
|y BK
|