Microscopy and analysis.

Microscopy and analysis.

Guardado en:

Detalles Bibliográficos
Autor principal:	Microscopy and analysis (Americas ed.)
Formato:	Sin ejemplares
Lenguaje:	Inglés
Publicado:	Bookham, Surrey : Rolston Gordon Communications.
Edición:	Americas ed.
Materias:	Microscopy > Periodicals. Microscopía > Periodicals.

Ejemplares similares

Electron microscopy and analysis /
por: Goodhew, Peter J.
Publicado: (c2001.)

Light and video microscopy /
por: Wayne, Randy.
Publicado: (c2009.)

Fundamentals of light microscopy and electronic imaging /
por: Murphy, Douglas B.
Publicado: (c2001.)

Handbook of microscopy : applications in materials science, solid-state physics, and chemistry /
Publicado: (c1997.)

Scanning transmission electron microscopy : imaging and analysis /
Publicado: (c2011.)

Principles of analytical electron microscopy /
Publicado: (c1986.)

Fundamentals of transmission electron microscopy /
por: Heidenreich, Robert D.
Publicado: (1964.)

Acoustic microscopy /
por: Briggs, Andrew.
Publicado: (1992.)

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /
por: Egerton, R. F.
Publicado: (c2005.)

Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis /
Publicado: (c2015.)

Microscopy for chemists /
por: Schaeffer, Harold F.
Publicado: ([1966, c1953])

Reflection electron microscopy and spectroscopy for surface analysis /
por: Wang, Zhong Lin.
Publicado: (1996.)

Thin foil preparation for electron microscopy /
por: Goodhew, Peter J.
Publicado: (1985.)

High-resolution electron microscopy /
por: Spence, John C. H.
Publicado: (2003.)

Advanced computing in electron microscopy /
por: Kirkland, Earl J.
Publicado: (c1998.)

Scanning tunneling microscopy /
Publicado: (c1993.)

Transmission electron microscopy : physics of image formation and microanalysis /
por: Reimer, Ludwig, 1928-
Publicado: (c1997.)

Introduction to conventional transmission electron microscopy /
por: De Graef, Marc.
Publicado: (2003.)

Energy-filtering transmission electron microscopy /
Publicado: (c1995.)

Sample preparation handbook for tranmission electron microscopy : techniques /
por: Ayache, Jeanne.
Publicado: (2010.)

Sample preparation handbook for tranmission electron microscopy : methodology /
por: Ayache, Jeanne.
Publicado: (2010.)

Electron microscopy of thin crystals /
por: Hirsch, P. B.
Publicado: (1965.)

Transmission electron microscopy : a textbook for materials science /
por: Williams, David B. 1949-
Publicado: (c1996, 2009.)

Transmission electron microscopy : a textbook for materials science /
por: Williams, David B. 1949-
Publicado: (c1996.)

Microscopía confocal
por: Pucciarelli, Mariana.
Publicado: (2009)

Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77) /
Publicado: (1977.)

Field-ion microscopy and related techniques : a bibliography, 1951-1978 /
Publicado: (1980.)

Electron microscopy in solid state physics /
Publicado: (1987.)

Principles of nuclear magnetic resonance microscopy /
por: Callaghan, Paul T.
Publicado: (c1991.)

Electron microscopy in material science /
por: International School of Electron Microscopy (1970 : Erice, Italy)
Publicado: (1971.)

Electron microprobe analysis and scanning electron microscopy in geology /
por: Reed, S. J. B.
Publicado: (1996.)

Técnicas avanzadas de microscopía electrónica /
por: Ipohorski, Miguel.
Publicado: (1990.)

Microscopía electrónica de láminas delgadas /
por: Ipohorski, Miguel.
Publicado: (1982.)

Microscopía electrónica de barrido /
por: Ipohorski, M.
Publicado: (1995.)

Alain Bourret Festschrift.
por: Annual meeting of the Société Française de Microscopie (2000 : Toulouse, France)
Publicado: (2001.)

Electron microscope specimen preparation techniques in materials science /
por: Thompson-Russell, K. C.
Publicado: (1977.)

Microscopía electrónica de barrido /
por: Ipohorski, Miguel.
Publicado: (1973.)

Microscopic methods in metals /
Publicado: (c1986.)

Scanning probe microscopy /
por: International Colloquium on Scanning Probe Microscopy (8th : 2000 : Shizuoka-ken, Japan)
Publicado: (c2001.)

Advanced scanning electron microscopy and X-ray microanalysis /
Publicado: (c1986.)