Analytical techniques for the characterization of compound semiconductors : proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /

Analytical techniques for the characterization of compound semiconductors : proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /

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Detalles Bibliográficos
Autor principal: Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors (1990 : Strasbourg, France)
Autor Corporativo: Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors
Otros Autores: Bastard, Gerald., Oppolzer, Helmut.
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam : North-Holland, 1991.
Colección:Applied Surface Science 1991 ; v. 50, no. 1-4
Materias:
Semiconductors > Analysis > Congresses.
Semiconductors > Optical properties > Congresses.
Descripción
Descripción Física:537 p. : il., tablas ; 24 cm.
Bibliografía:Incluye referencias bibliográficas e índice.

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