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| LEADER |
01275cam#a2200265#a#4500 |
| 008 |
910507s1991####ne#a#####b####101#0#eng## |
| 005 |
20060714093819.0 |
| 001 |
BCCAB007536 |
| 003 |
AR-BCCAB |
| 245 |
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|a Analytical techniques for the characterization of compound semiconductors :
|b proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /
|c [edited by] G. Bastard and H. Oppolzer.
|
| 260 |
# |
# |
|a Amsterdam :
|b North-Holland,
|c 1991.
|
| 300 |
# |
# |
|a 537 p. :
|b il., tablas ;
|c 24 cm.
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas e índice.
|
| 111 |
2 |
# |
|a Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors
|d (1990 :
|c Strasbourg, France)
|
| 700 |
1 |
# |
|a Bastard, Gerald.
|
| 700 |
1 |
# |
|a Oppolzer, Helmut.
|
| 080 |
# |
# |
|a 621.382:061.3
|
| 080 |
# |
# |
|a 538.935:061.3
|
| 650 |
# |
0 |
|a Semiconductors
|x Analysis
|v Congresses.
|
| 650 |
# |
0 |
|a Semiconductors
|x Optical properties
|v Congresses.
|
| 049 |
# |
# |
|a AR5A
|
| 490 |
1 |
# |
|a Applied Surface Science 1991 ;
|v v. 50, no. 1-4
|
| 040 |
# |
# |
|a DLC
|c DLC
|d OCL
|d NLGGC
|b spa
|d arbccab
|
| 942 |
# |
# |
|c BK
|
| 952 |
# |
# |
|2 udc
|7 NOT_LOAN
|a ARBCCAB
|b ARBCCAB
|i 007536_nuevo-0
|o APPL. SURF. SCI. 1991
|p 007536_nuevo-0
|t 1
|y BK
|
