Analytical techniques for the characterization of compound semiconductors : proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /

Analytical techniques for the characterization of compound semiconductors : proceedings of Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors of the 1990 E-MRS Fall Conference, Strasbourg, France, November 27-30, 1990 /

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Detalles Bibliográficos
Autor principal:	Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors (1990 : Strasbourg, France)
Autor Corporativo:	Symposium D on Analytical Techniques for the Characterization of Compound Semiconductors
Otros Autores:	Bastard, Gerald., Oppolzer, Helmut.
Formato:	Sin ejemplares
Lenguaje:
Publicado:	Amsterdam : North-Holland, 1991.
Colección:	Applied Surface Science 1991 ; v. 50, no. 1-4
Materias:	Semiconductors > Analysis > Congresses. Semiconductors > Optical properties > Congresses.

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