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| LEADER |
01267cam#a2200253ua#4500 |
| 008 |
020422s2002####ne#a##########101#0#eng#d |
| 005 |
20060727083459.0 |
| 001 |
BCCAB008449 |
| 003 |
AR-BCCAB |
| 245 |
1 |
0 |
|a Papers presented at the Ninth International Conference on Defects :
|b Recognition, Imaging and Physics in Semiconductors (DRIP-IX), Rimini, Italy, 24-28th September 2001 /
|c [guest editor, C. Fregeri].
|
| 260 |
# |
# |
|a Amsterdam :
|b Elsevier,
|c c2002.
|
| 300 |
# |
# |
|a xii, 559 p. :
|b il. (some col.) ;
|c 28 cm.
|
| 111 |
2 |
# |
|a International Conference on Defects: Recognition, Imaging and Physics in Semiconductors
|n (9th :
|d 2001 :
|c Rimini, Italy)
|
| 700 |
1 |
# |
|a Frigeri, C.
|q (Cesare)
|
| 246 |
3 |
0 |
|a Ninth International Conference on Defects :
|b Recognition, Imaging and Physics in Semiconductors
|
| 246 |
3 |
# |
|a DRIP-IX
|
| 650 |
# |
0 |
|a Semiconductors
|x Defects
|v Congresses.
|
| 490 |
1 |
# |
|a Materials science & engineering. B, Solid-state materials for advanced technology ;
|v v. B91-92 (30 Apr. 2002).
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas.
|
| 040 |
# |
# |
|a HNK
|c HNK
|d OCLCQ
|b spa
|d arbccab
|
| 500 |
# |
# |
|a "Special issue."--Cover.
|
| 500 |
# |
# |
|a Incluye indices.
|
| 942 |
# |
# |
|c BK
|
| 952 |
# |
# |
|2 udc
|7 NOT_LOAN
|a ARBCCAB
|b ARBCCAB
|i 008449_nuevo-0
|o MATER. SCI. ENG. B 2002
|p 008449_nuevo-0
|t 1
|y BK
|
