Particle induced x-ray emission and its analytical applications : proceedings of the 2nd International Conference on PIXE and Its Analytical Applications, Lund, Sweden, June 9-12, 1980 /

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Detalles Bibliográficos
Autor principal: International Conference on Particle Induced X-ray Emission and Its Analytical Applications (2nd : 1980 : Lund, Sweden)
Autor Corporativo: International Conference on Particle Induced X-ray Emission and Its Analytical Applications
Otros Autores: Johansson, Sven A. E., 1923-
Formato: Sin ejemplares
Lenguaje:
Publicado: Amsterdam : North-Holland, 1981.
Colección:Nuclear instruments & methods, v. 181
Materias:
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245 1 0 |a Particle induced x-ray emission and its analytical applications :  |b proceedings of the 2nd International Conference on PIXE and Its Analytical Applications, Lund, Sweden, June 9-12, 1980 /  |c editor, Sven A.E. Johansson. 
260 # # |a Amsterdam :  |b North-Holland,  |c 1981. 
300 # # |a xv, 546 p. :  |b il. ;  |c 27 cm. 
111 2 # |a International Conference on Particle Induced X-ray Emission and Its Analytical Applications  |n (2nd :  |d 1980 :  |c Lund, Sweden) 
700 1 # |a Johansson, Sven A. E.,  |d 1923- 
080 # # |a 543.422.8:061.3 
650 # 0 |a X-ray microanalysis  |v Congresses. 
650 # 0 |a X-ray spectroscopy  |v Congresses. 
490 1 # |a Nuclear instruments & methods,  |v v. 181  |x 0029-554X ; 
504 # # |a Incluye referencias bibliográficas. 
040 # # |a IWA  |c IWA  |d OCL  |b spa  |d arbccab 
500 # # |a Incluye índice. 
942 # # |c BK 
952 # # |2 udc  |7 NOT_LOAN  |a ARBCCAB  |b ARBCCAB  |i 008871_nuevo-0  |o NUCL. INSTRUM. METH. PHYS. RES. 1981  |p 008871_nuevo-0  |t 1  |y BK