Surface characterization by LEED, RHEED, REM, STM, and Holography : proceedings of the U.S.-Japan Seminar on Surface Characterization by Electon Diffraction, Reflection Electron Microscopy, and Holography, Kona, Hawaii, 16-19 March 1993 /

Surface characterization by LEED, RHEED, REM, STM, and Holography : proceedings of the U.S.-Japan Seminar on Surface Characterization by Electon Diffraction, Reflection Electron Microscopy, and Holography, Kona, Hawaii, 16-19 March 1993 /

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Detalles Bibliográficos
Autor principal: U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography (1993 : Kona, Hawaii)
Autor Corporativo: U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography
Otros Autores: Cohen, P. I., Ichimiya, A.
Formato: Sin ejemplares
Lenguaje:Inglés
Publicado: [Amsterdam, Netherlands] : North-Holland, 1993.
Colección:Surface Science 1993 ; v. 298, no. 2-3
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