Surface characterization by LEED, RHEED, REM, STM, and Holography : proceedings of the U.S.-Japan Seminar on Surface Characterization by Electon Diffraction, Reflection Electron Microscopy, and Holography, Kona, Hawaii, 16-19 March 1993 /

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Detalles Bibliográficos
Autor principal: U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography (1993 : Kona, Hawaii)
Autor Corporativo: U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography
Otros Autores: Cohen, P. I., Ichimiya, A.
Formato: Sin ejemplares
Lenguaje:
Publicado: [Amsterdam, Netherlands] : North-Holland, 1993.
Colección:Surface Science 1993 ; v. 298, no. 2-3
LEADER 01003nam#a2200205#a#4500
008 940113s1993####ne############100#0#eng#d
005 20060803103749.0
001 BCCAB008971
003 AR-BCCAB
245 1 0 |a Surface characterization by LEED, RHEED, REM, STM, and Holography :  |b proceedings of the U.S.-Japan Seminar on Surface Characterization by Electon Diffraction, Reflection Electron Microscopy, and Holography, Kona, Hawaii, 16-19 March 1993 /  |c edited by P.I. Cohen, A. Ichimiya. 
260 # # |a [Amsterdam, Netherlands] :  |b North-Holland,  |c 1993. 
300 # # |a vi, 495 p. 
111 2 # |a U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography  |d (1993 :  |c Kona, Hawaii) 
700 1 # |a Cohen, P. I. 
700 1 # |a Ichimiya, A. 
080 # # |a 538.971:061.3 
490 1 # |a Surface Science 1993 ;  |v v. 298, no. 2-3 
040 # # |a CAI  |c CAI  |b spa  |d arbccab 
942 # # |c BK 
952 # # |2 udc  |7 NOT_LOAN  |a ARBCCAB  |b ARBCCAB  |i 008971_nuevo-0  |o SURF. SCI. 1993  |p 008971_nuevo-0  |t 1  |y BK