Surface characterization by LEED, RHEED, REM, STM, and Holography : proceedings of the U.S.-Japan Seminar on Surface Characterization by Electon Diffraction, Reflection Electron Microscopy, and Holography, Kona, Hawaii, 16-19 March 1993 /
Guardado en:
Autor principal: | U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography (1993 : Kona, Hawaii) |
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Autor Corporativo: | U.S.-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy, and Holography |
Otros Autores: | Cohen, P. I., Ichimiya, A. |
Formato: | Sin ejemplares |
Lenguaje: | |
Publicado: |
[Amsterdam, Netherlands] :
North-Holland,
1993.
|
Colección: | Surface Science 1993 ;
v. 298, no. 2-3 |
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