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|a High resolution focused ion beams :
|b FIB and its applications : the physics of liquid metal ion sources and ion optics and their application to focused ion beam technology /
|c Jon Orloff, Mark Utlaut, and Lynwood Swanson.
|
| 260 |
# |
# |
|a New York :
|b Kluwer Academic/Plenum Publishers,
|c c2003.
|
| 300 |
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|a x, 303 p. :
|b il. ;
|c 26 cm.
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| 504 |
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|a Incluye referencias bibliográficas e índices.
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| 020 |
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|a 030647350X
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| 100 |
1 |
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|a Orloff, Jon.
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| 700 |
1 |
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|a Swanson, Lynwood,
|d 1934-
|
| 700 |
1 |
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|a Utlaut, Mark William,
|d 1949-
|
| 080 |
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|a 537.533.35
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| 650 |
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|a Focused ion beams
|x Industrial applications.
|
| 650 |
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|a Ion bombardment
|x Industrial applications.
|
| 010 |
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|a ##2002028661
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| 050 |
0 |
0 |
|a QC702.7.B65
|b O75 2003
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| 040 |
# |
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|a DLC
|c DLC
|d DLC
|b spa
|d arbccab
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| 856 |
4 |
1 |
|3 Indice
|u http://campi.cab.cnea.gov.ar/tocs/19942.pdf
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|a 621.3815/2
|2 21
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| 942 |
# |
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|c BK
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|2 udc
|a ARBCCAB
|b ARBCCAB
|d 20061228
|e Amazon
|g U$S162
|i 19942
|o 537.533.35 O711
|p 19942
|t 1
|y BK
|
