|
|
|
|
| LEADER |
00873nam#a2200229ua#4500 |
| 008 |
100205s2009####ja#a###f#b####101#0#eng#d |
| 005 |
20100205162836.0 |
| 001 |
BCCAB015948 |
| 003 |
AR-BCCAB |
| 245 |
1 |
0 |
|a Scanning probe microscopy.
|
| 260 |
# |
# |
|a Tokyo, Japan :
|b The Japan Society of Applied Physics,
|c 2009.
|
| 300 |
# |
# |
|a p. :
|b il. ;
|c 30 cm.
|
| 504 |
# |
# |
|a Incluye referencias bibliográficas.
|
| 490 |
1 |
# |
|a Japanese journal of applied physics ;
|v 48, no. 8,
|x 0021-4922
|
| 111 |
2 |
# |
|a International Colloquium on Scanning Probe Microscopy
|n (16h :
|d 2008 :
|c Atagawa Heights, Higashi-izu, Japan)
|
| 080 |
# |
# |
|a 537.533.35:061.3
|
| 650 |
# |
0 |
|a Scanning probe microscopy
|v Congresses.
|
| 040 |
# |
# |
|b spa
|d arbccab
|
| 500 |
# |
# |
|a "Special issue."
|
| 500 |
# |
# |
|a Incluye índice.
|
| 942 |
# |
# |
|c BK
|
| 952 |
# |
# |
|2 udc
|7 NOT_LOAN
|a ARBCCAB
|b ARBCCAB
|i 015948_nuevo-0
|o JPN. J. APPL. PHYS.
|p 015948_nuevo-0
|t 1
|y BK
|
