Scanning probe microscopy.
Guardado en:
Autor principal: | International Colloquium on Scanning Probe Microscopy (16h : 2008 : Atagawa Heights, Higashi-izu, Japan) |
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Autor Corporativo: | International Colloquium on Scanning Probe Microscopy |
Formato: | Sin ejemplares |
Lenguaje: | |
Publicado: |
Tokyo, Japan :
The Japan Society of Applied Physics,
2009.
|
Colección: | Japanese journal of applied physics ;
48, no. 8, |
Materias: |
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