Advanced scanning electron microscopy and X-ray microanalysis /

Advanced scanning electron microscopy and X-ray microanalysis /

Guardado en:

Detalles Bibliográficos
Otros Autores:	Newbury, Dale E.
Formato:	Libro
Lenguaje:
Publicado:	New York : Plenum Press, c1986.
Materias:	Scanning electron microscopy. X-ray microanalysis. Electron Probe Microanalysis. Microscopy, Electron, Scanning. Microscopía electrónica por barrido. Microanálisis.

Ejemplares similares

Scanning electron microscopy and x-ray microanalysis /
Publicado: (c2003.)

Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists /
Publicado: (c1992.)

Recent advances in electron and light optical imaging in biology and medicine /
Publicado: (1986.)

Scanning transmission electron microscopy : imaging and analysis /
Publicado: (c2011.)

Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis /
Publicado: (c2015.)

Scanning probe microscopy.
por: International Colloquium on Scanning Probe Microscopy (16h : 2008 : Atagawa Heights, Higashi-izu, Japan)
Publicado: (2009.)

Scanning probe microscopy /
por: International Colloquium on Scanning Probe Microscopy (8th : 2000 : Shizuoka-ken, Japan)
Publicado: (c2001.)

Electron microscopy and strength of crystals : proceedings of the First Berkeley International Materials Conference 'The impact of transmission electron microscopy on theories of the strength of crystals' /
por: Berkeley International Materials Conference (1st : 1961 : Berkeley)
Publicado: (1963.)

Quantitative electron-probe microanalysis.
por: Scott, V. D. 1928-
Publicado: (1995.)

Electron microprobe analysis and scanning electron microscopy in geology /
por: Reed, S. J. B.
Publicado: (1996.)

Microstructural characterization of materials /
por: Brandon, D. G.
Publicado: (c2008.)

SPM '99 : proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures, Seattle, USA, May-June1, 1999 /
por: International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures (1st : 1999 : Seattle)
Publicado: (2000.)

SPM 2000 : proceedings of the second International Conference on Scanning Probe Microscopy, Sensors and Nanostructures : Heidelberg, Germany, May 28-31, 2000 /
por: International Conference on Scanning Probe Microscopy, Sensors and Nanostructures (2nd : 2000 : Heidelberg, Germany)
Publicado: (2001.)

Scanning tunneling microscopy /
Publicado: (c1993.)

X-ray spectrometry in electron beam instruments /
Publicado: (c1995.)

Electron microscopy and analysis /
por: Goodhew, Peter J.
Publicado: (c2001.)

Principles of analytical electron microscopy /
Publicado: (c1986.)

Fundamentals of transmission electron microscopy /
por: Heidenreich, Robert D.
Publicado: (1964.)

Electron microscopy and microanalysis of crystalline materials /
Publicado: (c1979.)

Electron backscatter diffraction in materials science /
Publicado: (2009.)

Particle induced x-ray emission and its analytical applications : proceedings of the 2nd International Conference on PIXE and Its Analytical Applications, Lund, Sweden, June 9-12, 1980 /
por: International Conference on Particle Induced X-ray Emission and Its Analytical Applications (2nd : 1980 : Lund, Sweden)
Publicado: (1981.)

Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /
por: Egerton, R. F.
Publicado: (c2005.)

Advanced computing in electron microscopy /
por: Kirkland, Earl J.
Publicado: (c1998.)

Caracterización mecánica y microestructural de daño por fretting en materiales para tubos de generadores de vapor /
por: Soria, Sergio R.
Publicado: (2018.)

Electron microscopy of thin crystals /
por: Hirsch, P. B.
Publicado: (1965.)

Transmission electron microscopy : physics of image formation and microanalysis /
por: Reimer, Ludwig, 1928-
Publicado: (c1997.)

Electron microscopy in material science /
por: International School of Electron Microscopy (1970 : Erice, Italy)
Publicado: (1971.)

Thin foil preparation for electron microscopy /
por: Goodhew, Peter J.
Publicado: (1985.)

Developments in electron microscopy and analysis, 1977 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference held in Glasgow, 12-14 September 1977 (EMAG 77) /
Publicado: (1977.)

High-resolution electron microscopy /
por: Spence, John C. H.
Publicado: (2003.)

International Symposium on In-situ Electron Microscopy : Nagoya, Japan, 20-22 January 2003 /
por: International Symposium on In-situ Electron Microscopy (2003 : Nagoya-shi, Japan)
Publicado: (c2004.)

Transmission electron microscopy of materials /
por: Thomas, Gareth, 1932-
Publicado: (c1979.)

Electron microscope specimen preparation techniques in materials science /
por: Thompson-Russell, K. C.
Publicado: (1977.)

Transmission electron microscopy and diffractometry of materials /
por: Fultz, B.
Publicado: (c2002.)

Introduction to conventional transmission electron microscopy /
por: De Graef, Marc.
Publicado: (2003.)

Energy-filtering transmission electron microscopy /
Publicado: (c1995.)

High-resolution transmission electron microscopy and associated techniques /
Publicado: (1988.)

Maquinado de titanio adherido a paneles de materiales compuestos /
por: Stefanuto, Guido.
Publicado: (2013.)

The Application of electron microscopy to materials science : proceedings of an International Workshop, held in China, Gauonzhou, August 1988 /
Publicado: (1989.)

Sample preparation handbook for tranmission electron microscopy : techniques /
por: Ayache, Jeanne.
Publicado: (2010.)