International Symposium on In-situ Electron Microscopy : Nagoya, Japan, 20-22 January 2003 /

International Symposium on In-situ Electron Microscopy : Nagoya, Japan, 20-22 January 2003 /

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Detalles Bibliográficos
Autor principal:	International Symposium on In-situ Electron Microscopy (2003 : Nagoya-shi, Japan)
Autor Corporativo:	International Symposium on In-situ Electron Microscopy
Otros Autores:	Saka, H.
Formato:	Sin ejemplares
Lenguaje:
Publicado:	Abingdon, UK : Taylor & Francis, c2004.
Colección:	Philosophical magazine. structure and properties of condensed matter ; v. 84, no. 25-26 (2004 Set. 1-11).
Materias:	Electron microscopy > Congresses.

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